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Advantages include:
- For the first time ever, use handheld/portable XRF to identify Light Elements Si, Mg, Al and P without requiring attached compressed gas tank
- No Helium gas or compressed tanks to lug around
- No cumbersome vacuum pumps to wear or attach
- Just connect the vac-purge device for 5 seconds, disconnect and begin testing
- The Smart Software automatically optimizes testing conditions
With the emergence of the Silicon Drift Detector (SDD) technology, handheld XRF can now measure lighter elements at lower levels than ever before. For example, Titaniums, Red Metals, Nickel and Stainless alloys can all be directly analyzed for less than one percent aluminum or silicon.
From the Home of Innovative X-ray Technology, the Innov-X Omega Xpress Vacuum Analyzer with "rechargable vacuum (patent pending) OES type performance on Aluminum alloys with the simplicity and portability of a three pound, non-destructive handheld analyzer.
The Innov-X Equation:
Vacuum + SDD (Silicon Drift Detector) = Innovation!
This innovation offers superior handheld alloy analysis for Mg, Al, Si, P levels. While SDD technology alone is a significant advance for light element analysis, combining SDD with Vacuum provides the ultimate field ready solution for the challeng of analyzing aluminum alloys.
How It Works:
- At start-up, connect a small battery powered pump to the analyzer;
- Run the pump 5 seconds to "charge" the vacuum cell in the nose of the analyzer;
- Disconnect the pump and get up to 2 hours of unmatched speed, precision, analytical confidence & portability for sorting and analyzing aluminum alloys
The Vacuum Advantage:
While both Air and Vacuum based SDD analyzers from Innov-X will perform well for light elements (e.g. Al & Si) in non-aluminum alloys, quick, confident analysis of most aluminum grades requires Mg detection down to 0.5%. The Innov-X Systems Omega Xpress Vacuum analyzer can perform this feat in as little as 15 seconds. Beyond superior analytical performance, the patent pending "rechargeable" vacuum system has several simple, practical advantages:
- Ergonomics - no attached purge source (pump or compressed helium) required:
- Field Worthy Design
- Real-time Vacuum Measurement
- Analyzer will only allow testing when vacuum is in range
- Protects the analyzer - if the window ruptures, the analyzer immediately notifies the user - not only does this elimnate testing without proper purge in place, it stops usage immediately, which prevents dust from contaminating an analyzer with a broken prolene window.
- Minimal contact between window and sample
- Minimal contamination - concave window shape minimizes contact/contamination from dirty samples
- Maximum window life - concave window shape minimizes contact/abrasion/wear from rough sample surfaces
- Clean and durable - concave shape minimizes contact between the ultra lightweight window and the sample. This built-in protection keeps the window clean and maximizes window life.
- Efficient & Cost Effective Solution
- No purge gas to stock or buy (offering consumable savings of as much as $10,000K per year)
- Safe and simple - no pressurized gas cylinders to order, stock, carry
- Easy change replacement windows - nominally less than $1 each
- Shortest test times, best precision
- Most grades for Aluminum Analysis - download grade library below
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| Weight |
2.625 lbs. (base wt.) 3.375 lbs. (1.6kg) with batteries |
| Excitation Source |
X-ray tube, Mo anode, up to 40 keV, up to 80 micro amps, up to 5 filter positions |
| Detector |
Si PiN diode detector, < 180 eV FWHM at 5.95 keV Mn K-alpha line. |
| Temperature Range |
-10°C to +50°C |
| Operation |
One-touch trigger or “deadman” trigger option. Optional control from external PC |
| Power Requirements |
Li-ion batteries, rechargeable (charger included). Powers analyzer and iPAQ simultaneously. AC Adapter optional |
| Number of Elements |
Standard package includes 21 elements plus Mg, Al, Si and P. Customer may specify 4 additional, or use multiple suites of 25 elements each |
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